Bollet, Fabrice and Gwilliam, R. and Hopkinson, M. and Gillin, W. (2005) Concentration dependent interdiffusion in InGaAs/GaAs as evidenced by high resolution x-ray diffraction and photoluminescence spectroscopy. Journal of Applied Physics, 97 (013536). p. 4. ISSN 00218979
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Concentration dependent interdiffusion in
InGaAs/GaAs as evidenced by high resolution x-ray diffraction and photoluminescence spectroscopy. (deposited 04 Dec 2009 12:16)
- Concentration dependent interdiffusion in InGaAs/GaAs as evidenced by high resolution x-ray diffraction and photoluminescence spectroscopy. (deposited 15 Feb 2010 16:13) [Currently Displayed]
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