Borer, K. and Janos, S. and Palmieri, V.G. and Buytaert, J. and Chabaud, V. and Chochula, P. and Collins, P. and Dijkstra, H. and Niinikoski, T.O. and Lourenço, C. and Parkes, C. and Saladino, S. and Ruf, T. and Granata, V. and Pagano, S. and Vitobello, F. and Bell, W. and Bartalini, P. and Dormond, O. and Frei, Regina and Casagrande, L. and Bowcock, T. and Barnett, I.B.M. and Da Via, C. and Konorov, I. and Paul, S. and Schmitt, L. and Ruggiero, G. and Stavitski, I. and Esposito, A. (2000) Charge collection efficiency and resolution of an irradiated double-sided silicon microstrip detector operated at cryogenic temperatures. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 440 (1). 17 - 37. ISSN 0168-9002
Type of Research: | Article |
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Creators: | Borer, K. and Janos, S. and Palmieri, V.G. and Buytaert, J. and Chabaud, V. and Chochula, P. and Collins, P. and Dijkstra, H. and Niinikoski, T.O. and Lourenço, C. and Parkes, C. and Saladino, S. and Ruf, T. and Granata, V. and Pagano, S. and Vitobello, F. and Bell, W. and Bartalini, P. and Dormond, O. and Frei, Regina and Casagrande, L. and Bowcock, T. and Barnett, I.B.M. and Da Via, C. and Konorov, I. and Paul, S. and Schmitt, L. and Ruggiero, G. and Stavitski, I. and Esposito, A. |
Description: | This paper presents results on the measurement of the cluster shapes, resolution and charge collection efficiency of a double-sided silicon microstrip detector after irradiation with 24GeV protons to a fluence of 3.5×1014p/cm2 and operated at cryogenic temperatures. An empirical model is presented which describes the expected cluster shapes as a function of depletion depth, and is shown to agree with the data. It is observed that the clusters on the p-side broaden if the detector is under-depleted, leading to a degradation of resolution and efficiency. The model is used to make predictions for detector types envisaged for the LHC experiments. The results also show that at cryogenic temperature the charge collection efficiency varies depending on the operating conditions of the detector and can reach values of 100 at unexpectedly low bias voltage. By analysing the cluster shapes it is shown that these variations are due to changes in depletion depth. This phenomenon, known as the “Lazarus effect”, can be related to similar recent observations on diode behaviour. |
Official Website: | https://www.sciencedirect.com/science/article/abs/pii/S0168900299008001 |
Publisher/Broadcaster/Company: | Elsevier |
Your affiliations with UAL: | Colleges > London College of Fashion |
Date: | 10 January 2000 |
Digital Object Identifier: | 10.1016/S0168-9002(99)00800-1 |
Date Deposited: | 02 Aug 2024 14:28 |
Last Modified: | 14 Aug 2024 14:26 |
Item ID: | 22351 |
URI: | https://ualresearchonline.arts.ac.uk/id/eprint/22351 |
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